Test arrangement for the non-destructive testing of metallic tes

Details Test arrangement for the non-destructive testing of metallic tes Test arrangement for the non-destructive testing of metallic tes

1979-04-09

1982-02-02

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

Magnetic test structure elements

324238, G01R 3300, G01N 2782

Patent

active

043142036

ABSTRACT:
A test arrangement for non-destructive defect testing of metallic test pieces includes test probes which contactingly move across the surface of a test piece. Resilient members act on the testhead carrying the probes, one at each side of the testhead center of gravity, enabling the testhead to extend beyond the test piece edge while maintaining good contact between the probes and test piece. The testhead is adjustable with respect to the test piece surface and is maintained at a constant spacing from the test piece irrespective of test piece surface irregularities.

REFERENCES:
patent: 2219885 (1940-10-01), Barnes et al.
patent: 3244972 (1966-04-01), Fisher
patent: 3311819 (1967-03-01), Miller
patent: 3593120 (1971-07-01), Mandula et al.
patent: 4041379 (1977-08-01), Karlsson

Affiliated with

Also associated with

Rating

Test arrangement for the non-destructive testing of metallic tes does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test arrangement for the non-destructive testing of metallic tes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test arrangement for the non-destructive testing of metallic tes will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1823480