Test apparatus that tests a device under test and connecting...

Details Test apparatus that tests a device under test and connecting... Test apparatus that tests a device under test and connecting...

2008-03-13

2010-06-01

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755090

Reexamination Certificate

active

07728615

ABSTRACT:
Provided is a test apparatus that tests a device under test, including a test head that generates a test signal for testing the device under test; a socket board onto which is mounted the device under test, that transmits signals between the test head and the device under test; a plurality of actuators that are disposed on a lower surface of the socket board to correspond one-to-one with support positions thereof, and that each have a state thereof changed according to a control signal supplied thereto to independently move the corresponding support position in a direction vertical to the lower surface of the socket board; and a connection control section that supplies a first control signal to each actuator to set each actuator to be in the same state, and thereafter supplies commonly to each actuator a second control signal that gradually decreases an apparatus separation distance between the socket board and the test head.

REFERENCES:
patent: 5295853 (1994-03-01), Nagakusa et al.
patent: 5654631 (1997-08-01), Ames
patent: 2002-257908 (2002-09-01), None

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