Test apparatus, pin electronics card, electrical device and...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

active

07876120

ABSTRACT:
Provided is a test apparatus for testing a device under test, the test apparatus including: a pattern generating section that inputs a test pattern to the device under test; a judging section that receives an output signal of the device under test, and makes judgment concerning pass/fail of the device under test based on the output signal; an internal circuit that exchanges signals between the device under test and the pattern generating section or the judging section; a first transmission line that connects the internal circuit to the device under test; and a first switch that connects the first transmission line to a ground potential in not testing the device under test, and cuts off the first transmission line from the ground potential in testing of the device under test.

REFERENCES:
patent: 6020752 (2000-02-01), Shimasaki
patent: 6505315 (2003-01-01), Kojima
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patent: 2007/0136628 (2007-06-01), Doi et al.
patent: 2010/0001776 (2010-01-01), Nakamura et al.
patent: 2010/0030508 (2010-02-01), Gake
patent: 2010/0213966 (2010-08-01), Kojima
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patent: 2000-009804 (2000-01-01), None
patent: 2001-035632 (2001-02-01), None
patent: 2001-53597 (2001-02-01), None
patent: 2002-061781 (2002-08-01), None
patent: 0387552 (2003-06-01), None
German Office Action in counterpart application DE 11 2006 002 853.7-35, dated Mar. 10, 2010, citing U.S. Patent No. 1 listed above and JP2000-009804 which has been submitted in a previous IDS. Translation of the Office Action is attached as a concise explanation of relevance.
KIPO Office action dated Jun. 22, 2010, in counterpart application KR10-2010-7006554 citing Foreign Patent Documents Nos. 1-2 above and US20040022044 which has been submitted in a previous IDS.

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