Test apparatus for time dependent dielectric breakdown

Details Test apparatus for time dependent dielectric breakdown Test apparatus for time dependent dielectric breakdown

1997-04-30

2000-08-22

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3126

Patent

active

061078166

ABSTRACT:
A test structure and test fixture which are capable of measuring time dependent dielectric breakdown under accelerated temperature test conditions which can extend to 300.degree. C. The test structure is a parallel plate configuration with metal electrodes which is insensitive to polarity. The test fixture employs a ceramic or polymide body which remains rigid and well isolated electrically under these test conditions

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patent: 4476433 (1984-10-01), Logan
patent: 5023561 (1991-06-01), Hillard
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patent: 5126662 (1992-06-01), Jinbo
patent: 5239270 (1993-08-01), Desbiens
patent: 5808475 (1998-09-01), Knauer et al.

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