Test apparatus for testing an electronic device

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Details

C324S765010

Reexamination Certificate

active

10938753

ABSTRACT:
There is provided a test apparatus including: a test module operable to supply test patterns to the electronic device; a main signal source operable to generate a first timing signal in accordance with a phase of the supplied timing signal and supply it to the test module; and a sub-signal source operable to receive the timing signal from the main signal source, generate a second timing signal for controlling timing at which the test module supplies the test patterns to the electronic device, and supply it to the test module. The sub-signal source includes a phase adjustment circuit that substantially uniforms the timing at which the main signal source outputs the first timing signal and the timing at which the sub-signal source outputs the second timing signal by delaying the timing signal received from the main signal source.

REFERENCES:
patent: 5794175 (1998-08-01), Conner
patent: 6005408 (1999-12-01), Gillette
patent: 6232759 (2001-05-01), Wohlfarth
patent: 6263463 (2001-07-01), Hashimoto
patent: 6466007 (2002-10-01), Prazeres da Costa et al.
patent: 6549000 (2003-04-01), Ebiya
patent: 6567941 (2003-05-01), Turnquist et al.
patent: 6771061 (2004-08-01), Sartschev et al.
patent: 2004/0044938 (2004-03-01), Heo
patent: 2004/0251914 (2004-12-01), Doi et al.
patent: 61-176871 (1986-08-01), None
patent: 03-216568 (1991-09-01), None
patent: 10-197611 (1998-07-01), None
patent: 11-304888 (1999-11-01), None
patent: 2002-139556 (2002-05-01), None
Patent Abstracts of Japan publication No. 11-304888, published on Nov. 5, 1999 (1 page).
Patent Abstracts of Japan publication No. 61-176871, published on Aug. 8, 1986 (1 page).
Patent Abstracts of Japan publication No. 03-216568, published on Sep. 24, 1991 (1 page).
Patent Abstracts of Japan publication No. 10-197611, published on Jul. 31, 1998 (1 page).
Patent Abstracts of Japan publication No. 2002-139556, published on May 17, 2002 (1 page).
PCT International Search Report with Written Opinion dated Dec. 28, 2004 (6 pages).

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