Test apparatus for electronic components

Details Test apparatus for electronic components Test apparatus for electronic components

1996-05-16

2000-08-15

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

165 111, G01R 102

Patent

active

06104203&

ABSTRACT:
A test apparatus (1) has a temperature controlled chuck (8) which provides good mechanical stability across a wide temperature range. This significantly reduces the number of times the probes (9) must be re-positioned, and in some cases eliminates such re-positioning. The chuck (8) has a support plate (20) which is connected to a base plate (35) by pillars (40) which have a low thermal expansion coefficient. This limits thermal expansion between the support plate (20) and the base plate (35). In addition, the heat transfer means is mounted so that thermal expansion is accommodated internally.

REFERENCES:
patent: 4491173 (1985-01-01), Demand
patent: 4791364 (1988-12-01), Kufis et al.
patent: 4870355 (1989-09-01), Kufis et al.
patent: 5001423 (1991-03-01), Abrami et al.
patent: 5084671 (1992-01-01), Miyata et al.
patent: 5315240 (1994-05-01), Jones
patent: 5420521 (1995-05-01), Jones

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