Test apparatus for defects of plate

Details Test apparatus for defects of plate Test apparatus for defects of plate

1981-10-07

1984-07-17

McGraw, Vincent P.

Optics: measuring and testing

Inspection of flaws or impurities

Having predetermined light transmission regions

356239, 250563, G01N 2188

Patent

active

044602731

ABSTRACT:
A test apparatus for detecting defects on a plate is disclosed. An illumination light is focused to one surface of the plate and another illumination light is focused to the other surface of the plate, and scattered light from the defects on the surfaces are detected to separately detect the defects on the front and rear surfaces of the plate.

REFERENCES:
patent: 3536405 (1970-10-01), Flower
patent: 3536409 (1970-10-01), Flower
patent: 3836261 (1974-09-01), Clarke
patent: 3972616 (1976-08-01), Minami et al.
patent: 4030830 (1977-06-01), Holly
patent: 4148065 (1979-04-01), Nakagawa

Affiliated with

Also associated with

Rating

Test apparatus for defects of plate does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test apparatus for defects of plate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test apparatus for defects of plate will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1488321