Test apparatus for circuits having a multiplex input/output term

Details Test apparatus for circuits having a multiplex input/output term Test apparatus for circuits having a multiplex input/output term

1981-08-10

1984-09-18

Strecker, Gerard R.

Electricity: measuring and testing

Plural, automatically sequential tests

G01R 1512, G01R 3128

Patent

active

044726783

ABSTRACT:
A test circuit (10) provides high and low reference voltages to a circuit (92) under test. A load (52) is connected to a multiplexed terminal (90) of circuit (92). A current source transistor (48) and a current sink transistor (132) are connected to provide current through load (52). A feedback network is connected to the current source transistor (48) and a second feedback network is connected to the current sink transistor (132). The feedback signals are compared to the reference voltages to generate control signals for driving the multiplexed terminal (90) accurately to the desired reference voltage. When the circuit (92) under test generates logic signals the load (52) sources or sinks the appropriate current depending upon the voltage states generated by the circuit (92). The voltage states generated at the multiplexed terminal (90) are transmitted through a buffer (148) to an output terminal (156). Thus, the load (52) is connected to the multiplexed terminal (90) at all times to provide the correct load for circuit (92) but does not degrade the reference voltages applied to terminal (90) due to the operation of the feedback networks.

REFERENCES:
patent: 3922537 (1975-11-01), Jackson
patent: 4045733 (1977-08-01), Dolan et al.

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