Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-05-17
2011-05-17
Tang, Minh N (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S756060, C324S762010, C324S073100
Reexamination Certificate
active
07944226
ABSTRACT:
A test apparatus for testing a device under test includes a test signal generating section that generates a test signal to be supplied to the device under test, a main driving section that outputs an output voltage determined in accordance with the test signal, to an input/output pin connected to a signal input/output terminal of the device under test, a replica driving section that outputs a comparison voltage determined in accordance with the test signal, a resistance voltage dividing section that generates a divided voltage by resistance-dividing the comparison voltage, a comparing section that compares a voltage of the input/output pin with the divided voltage, a judging section that judges acceptability of the device under test based on a result of the comparison by the comparing section, and an adjusting section that adjusts a voltage dividing ratio of the resistance voltage dividing section so that the divided voltage becomes equal to a voltage obtained by adding together a predetermined threshold voltage and a voltage of the input/output pin that is observed when the main driving section has output the output voltage and the signal input/output terminal of the device under test has not output a response signal.
REFERENCES:
patent: 6133725 (2000-10-01), Bowhers
patent: 6275023 (2001-08-01), Oosaki et al.
patent: 6956393 (2005-10-01), Tanaka
patent: 7373574 (2008-05-01), Kojima
patent: 2006/0010360 (2006-01-01), Kojima
patent: 2002-507754 (2002-03-01), None
patent: 2006-23233 (2006-01-01), None
International Search Report (ISR) issued in PCT/JP2008/062354 (parent application) for Examiner consideration, citing U.S. Patents Nos. 1-2, and Foreign Patent Document Nos. 1-2 listed above.
Written Opinion (PCT/ISA/237) issued in PCT/JP2008/062354 (parent application).
Advantest Corporation
Chen Yoshimura LLP
Tang Minh N
LandOfFree
Test apparatus and transmission apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test apparatus and transmission apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test apparatus and transmission apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2696772