Test apparatus and testing method

Details Test apparatus and testing method Test apparatus and testing method

2007-06-26

2007-06-26

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C714S736000

Reexamination Certificate

active

11180896

ABSTRACT:
A test apparatus that tests a device under test, including a main memory having an expectation pattern storing region storing an expectation pattern sequence to be sequentially compared with output patterns sequentially output from a terminal of the device; a test pattern outputting unit for sequentially inputting a plurality of test patterns into the device; a capture unit for sequentially acquiring the output patterns into an output pattern storing region on the main memory; a memory reading unit for reading an output pattern sequence consisting of the plurality of acquired output patterns and the expectation pattern sequence from the main memory when the acquisition process acquiring the output patterns into the output pattern storing region has been terminated; and an expectation comparing unit for comparing the read expectation pattern sequence and the output pattern sequence.

REFERENCES:
patent: 6198273 (2001-03-01), Onishi et al.
patent: 6653855 (2003-11-01), Mori et al.
patent: 6727723 (2004-04-01), Shimizu et al.
patent: 6784686 (2004-08-01), Nishida et al.
patent: 6966019 (2005-11-01), Viens et al.
patent: 6975956 (2005-12-01), Chang et al.
patent: 2002-174661 (2002-06-01), None
International Search Report issued for PCT application No. PCT/JP2005/012826 mailed on Oct. 25, 2005, 2 pages.

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