Data processing: measuring – calibrating – or testing – Testing system – For transfer function determination
Reexamination Certificate
2007-12-25
2007-12-25
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
For transfer function determination
C702S120000
Reexamination Certificate
active
11056330
ABSTRACT:
A testing apparatus for testing a device under test (DUT) includes a performance board; a main frame for generating a test signal for testing the DUT and determining pass/fail of the DUT based on an output signal output by the DUT; a pin electronics between the main frame and the performance board and performs sending and receiving signals between the main frame and the DUT; a deterministic jitter injecting unit for receiving the output signal without passing through the pin electronics and inputting a loop signal, which is the received output signal into which a deterministic jitter is injected, to an input pin of the DUT without passing through the pin electronics; and a switching unit for determining whether the input pin of the DUT is provided with the test signal output by the pin electronics or the loop signal output by the deterministic jitter injecting unit.
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Ishida Masahiro
Soma Mani
Yamaguchi Takahiro
Advantest Corporation
Barlow John
Osha•Liang LLP
Sievers Lisa
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