Test apparatus and test method for testing a device under...

Details Test apparatus and test method for testing a device under... Test apparatus and test method for testing a device under...

2011-06-21

2011-06-21

Nguyen, Vinh P (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762020

Reexamination Certificate

active

07965093

ABSTRACT:
Provided is a test apparatus for testing a device under test, including a multi-strobe generating section that generates, for each prescribed test cycle, a multi-strobe that includes a plurality of strobes arranged at prescribed time intervals, a data detecting section that detects a logic value of a response signal output by the device under test, according to each strobe, and a data width detecting section that detects a data width indicating a period during which the logic value of the response signal matches a prescribed expected value, based on each change point of a logic value output by the data detecting section.

REFERENCES:
patent: 6401225 (2002-06-01), Miura
patent: 6789224 (2004-09-01), Miura
patent: 6865698 (2005-03-01), Housako
patent: 7398169 (2008-07-01), Yamaguchi et al.
patent: 2007/091413 (2007-08-01), None
patent: 2008136301 (2008-11-01), None
patent: 2009001451 (2008-12-01), None
“Search Report of PCT Counterpart Application” issued on May 18, 2010, p. 1-p. 8.

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