Test apparatus and test method

Details Test apparatus and test method Test apparatus and test method

2007-11-20

2007-11-20

Benson, Walter (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S763010, C324S765010

Reexamination Certificate

active

11699594

ABSTRACT:
Change in power supply voltage supplied to a device under test is controlled. There is provided a test apparatus for testing a device under test, the test apparatus including: a reference voltage supply section for supplying a reference voltage; a field effect transistor provided between a positive side terminal and a negative side terminal of the reference voltage supply section, so that a drain terminal and a source terminal of the field effect transistor are in parallel connection with the device under test; an inductance that is connected between the positive side terminal and the negative side terminal of the reference voltage supply section, the inductance being in serial connection with the device under test between a positive-side power supply terminal and a negative-side power supply terminal of the device under test, and being in serial connection with the field effect transistor between the drain terminal and the source terminal of the field effect transistor; a control section for controlling a gate voltage of the field effect transistor, thereby changing a power supply voltage to be supplied to the device under test; and a judgment section for judging quality of the device under test, based on characteristic of the device under test in accordance with change in the power supply voltage.

REFERENCES:
patent: 5128618 (1992-07-01), Yamada et al.
patent: 5392293 (1995-02-01), Hsue

Affiliated with

Also associated with

Rating

Test apparatus and test method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test apparatus and test method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test apparatus and test method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3839612