Test apparatus and test method

Details Test apparatus and test method Test apparatus and test method

2007-01-26

2008-12-30

Dole, Timothy J (Department: 2831)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S523000, C324S765010

Reexamination Certificate

active

07471092

ABSTRACT:
A test apparatus to test a device under test (DUT) to which a reference voltage of a predetermined high voltage is supplied is provided. The test apparatus includes a reference voltage applying section that applies the reference voltage to the DUT, wherein the reference voltage defines a voltage level that is to be possessed by an output signal output from the DUT when the output signal indicates a predetermined logical value, a voltage level detecting section that detects a voltage level of the reference voltage, a signal comparing section that compares the output signal with an expected value signal, a reference voltage comparing section that judges whether the voltage level of the reference voltage detected by the voltage level detecting section falls within a predetermined expected voltage range, and a judging section that judges whether the DUT is good or bad based on a result of the comparison done by the signal comparing section, under a condition that the voltage level of the reference voltage falls within the expected voltage range.

REFERENCES:
patent: 5200696 (1993-04-01), Menis et al.
patent: 6498473 (2002-12-01), Yamabe
patent: 7049850 (2006-05-01), Shimizu
patent: 2005/0144539 (2005-06-01), Orita

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