Test apparatus and test method

Details Test apparatus and test method Test apparatus and test method

2007-10-23

2007-10-23

Ramos-Feliciano, Eliseo (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

C714S724000

Reexamination Certificate

active

11179330

ABSTRACT:
There is provided a testing device including: a first signal comparator operable to acquire a value of an output pattern based on a result that is obtained by comparing a voltage of an output signal and a first threshold value voltage in a first strobe timing, in order to acquire a first output pattern sequence; a second signal comparator operable to acquire a value of an output pattern based on a result that is obtained by comparing a voltage of an output signal and a second threshold value voltage in a second strobe timing, in order to acquire a second output pattern sequence; a header pattern sequence detecting unit operable to detect that the first output pattern sequence is identical with a header pattern sequence; and an expectation comparing unit operable to output a comparison result between the second output pattern sequence acquired by the second signal comparator and an expectation pattern sequence when detecting a correspondence between the first output pattern sequence and the header pattern sequence.

REFERENCES:
patent: 6021515 (2000-02-01), Shimura
patent: 6182255 (2001-01-01), Ohtomo
patent: 2002/0073373 (2002-06-01), Nakao et al.
patent: 11-248804 (1999-09-01), None
patent: 2002-139557 (2002-05-01), None
International Search Report for International Application No. PCT/JP2005/010829 mailed on Aug. 30, 2005, 2 pages.

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