Test apparatus and test method

Details Test apparatus and test method Test apparatus and test method

2007-11-20

2007-11-20

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

11331815

ABSTRACT:
A test apparatus for testing switching speed of a circuit, which includes a pre-stage logic element outputting a first or second level voltage and a post-stage logic element to which the output signal of the pre-stage logic element is input, is provided, wherein the post-stage logic element includes the post-stage FET, a gate terminal of which the output signal is input to, for outputting a different level of voltage according to the case that the output signal voltage is higher or lower than a predetermined threshold voltage, and the test apparatus includes a threshold voltage setting unit for setting a threshold voltage of a post-stage field effect transistor (FET) to be different from that in a normal operation by setting a substrate voltage of the post-stage FET to have a value different from that in the normal operation of the circuit; a delay time measuring unit for measuring a delay time of the circuit to which the threshold voltage different from that in the normal operation is set; and an error detecting unit for detecting an error in switching speed of the circuit based on the delay time.

REFERENCES:
patent: 4712058 (1987-12-01), Branson et al.
patent: 5065091 (1991-11-01), Tobita
patent: 5157627 (1992-10-01), Gheewala
patent: 5834967 (1998-11-01), Kuroda et al.
patent: 5942922 (1999-08-01), Dinteman et al.
patent: 5-72287 (1993-03-01), None
PCT Office Action dated Jan. 10, 2006 (3 pages).
Patent Abstracts of Japan; Publication No. 05-072287 dated Mar. 23, 1993 (2 pages).

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