Test apparatus and test method

Details Test apparatus and test method Test apparatus and test method

2011-04-26

2011-04-26

Dole, Timothy J (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C375S226000, C375S291000, C375S371000, C714S709000, C714S715000

Reexamination Certificate

active

07932729

ABSTRACT:
Provided is a test apparatus that tests a device under test, comprising a pattern generating section that generates a test pattern determined according to a test signal to be supplied to the device under test; a timing signal generating section that generates a timing signal indicating a timing for supplying the test signal to the device under test; a digital filter that filters the test pattern to output a jitter control signal representing jitter corresponding to the test pattern; a jitter injecting section that injects the timing signal with jitter by delaying the timing signal according to the jitter control signal; and a waveform shaping section that generates the test signal formed according to the test pattern, with the timing signal into which the jitter is injected as a reference.

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International Search Report (ISR) for PCT/JP2008/057710.
Written Option (PCT/ISA/237) of PCT/JP2008/057710.

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