Test apparatus and method for reliability assessment of high...

Details Test apparatus and method for reliability assessment of high... Test apparatus and method for reliability assessment of high...

2005-03-22

2005-03-22

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754120

Reexamination Certificate

active

06870378

ABSTRACT:
A test apparatus and method is provided for dynamic thermal and electrical fatigue testing of a semiconductor in an operating environment, such as air, that mimic thermal and electrical stress in the semiconductor during high power switching in the operating environment. Comparisons of pre- and post-testing electrical measurements, i.e., current, voltage and contact resistance, are combined to provide an indicator or long-term reliability.

REFERENCES:
patent: 5414370 (1995-05-01), Hashinaga et al.
patent: 5422498 (1995-06-01), Nikawa et al.
patent: 5952837 (1999-09-01), Koyama
patent: 6677760 (2004-01-01), Koyama

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