Test apparatus and measurement apparatus for measuring an...

Details Test apparatus and measurement apparatus for measuring an... Test apparatus and measurement apparatus for measuring an...

2008-09-19

2010-11-02

He, Amy (Department: 2831)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S765010

Reexamination Certificate

active

07825666

ABSTRACT:
There is provided a test apparatus for testing a device under test, which includes a voltage supplying section that supplies a voltage to the device under test through a wire, a first capacitor that is arranged between the wire and a common potential in series, a current detecting section that detects a current flowing through the wire at a location closer to the device under test than the first capacitor is, an integrating section that outputs an integration value obtained by integrating a difference between the current detected by the current detecting section and a predetermined reference current, and a judging section that judges whether the device under test is a pass or a failure based on the integration value.

REFERENCES:
patent: 4710704 (1987-12-01), Ando
patent: 5479130 (1995-12-01), McCartney
patent: 6087843 (2000-07-01), Pun et al.
patent: 7005867 (2006-02-01), Hashimoto
patent: 7132844 (2006-11-01), Hashimoto

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