Test apparatus and control method

Details Test apparatus and control method Test apparatus and control method

2007-06-26

2007-06-26

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

C714S025000

Reexamination Certificate

active

11136335

ABSTRACT:
A testing device that tests an electronic device includes: a pattern generator operable to generate a test pattern to be supplied to the electronic device and an expectation signal sequence to be output from the electronic device when the test pattern is supplied to the electronic device; a comparison unit operable to compare an output signal sequence output from the electronic device according to the test pattern with the expectation signal sequence; an acquisition controlling unit operable to cause the comparison unit to start comparing the output signal sequence and the expectation signal sequence when detecting an output header, which indicates the start of a comparison between the output signal sequence and the expectation signal sequence using the comparison unit, from the output signal sequence; and a comparison result outputting unit operable to acquire a comparison result from the comparison unit according to an instruction from the acquisition controlling unit.

REFERENCES:
patent: 6453435 (2002-09-01), Limon et al.
patent: 2001/0034866 (2001-10-01), Barry et al.

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