Test apparatus

Details Test apparatus Test apparatus

2008-03-26

2010-10-19

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S617000, C324S765010, C324S1540PB, C714S707000, C714S715000, C714S731000

Reexamination Certificate

active

07816935

ABSTRACT:
Provided is a test apparatus that tests a device under test, including a first pipeline that sequentially propagates pieces of pattern data included in a first test pattern, according to a first test period, and outputs the resulting data to the device under test; a second pipeline that sequentially propagates pieces of pattern data included in a second test pattern, according to a second test period that is different from the first test period, and outputs the resulting data to the device under test; a timing control section that controls at least one of a timing at which the first pipeline begins propagating a predetermined first pattern data and a timing at which the second pipeline begins propagating a predetermined second pattern data, based on the first test period and the second test period; and a judging section that judges pass/fail of the device under test based on a signal output by the device under test.

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