Test apparatus

Details Test apparatus Test apparatus

2007-03-21

2010-02-02

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07656177

ABSTRACT:
There is provided a test apparatus that tests an electronic device. The test apparatus includes a socket board in which a socket for mounting thereon the electronic device is provided, and a test head that detachably holds the socket board and transmits source power to the electronic device via the socket board, the test head includes a first source power transmission line that transmits the source power to the socket board, a first bypass capacitor that is provided between the first source power transmission line and ground potential, and a switch that switches whether the first bypass capacitor is connected between the first source power transmission line and the ground potential, and the socket board includes a second source power transmission line that transmits the source power to the electronic device, and a second bypass capacitor that is fixedly connected between the second source power transmission line and the ground potential.

REFERENCES:
patent: 07-248353 (1995-09-01), None
patent: 09-043284 (1997-02-01), None
patent: 10-213608 (1998-08-01), None
patent: 2002-071755 (2002-03-01), None
patent: WO 2006/054435 (2006-05-01), None

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