Test apparatus

Details Test apparatus Test apparatus

2007-09-04

2007-09-04

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

11119344

ABSTRACT:
A test apparatus for testing electronic devices, comprising a control section for generating control signals based on a test program set in advance to test the electronic devices, a plurality of test modules for generating test signals to be supplied to the electronic devices on the basis of the control signals, a device interface having connectors, provided in correspondence to the plurality of test modules, for supplying the test signals generated by corresponding test modules to predetermined pins of the electronic devices, wherein a test module for generating source power to be supplied to the electronic device outputs the source power only when it is connected with a connector set in advance among the plurality of connectors and does not output source power when it is not connected with the connector set in advance.

REFERENCES:
patent: 4397021 (1983-08-01), Lloyd et al.
patent: 5386189 (1995-01-01), Nishimura et al.
patent: 5426361 (1995-06-01), Simmons
patent: 5640102 (1997-06-01), Sato
patent: 8-179011 (1996-07-01), None
patent: 9-166637 (1997-06-01), None
patent: 2004-177160 (2004-06-01), None
International Search Report issued in International application No. PCT/JP2004/018664 mailed on May 4, 2005, 2 pages.

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