Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-11-14
2006-11-14
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S763010, C714S738000
Reexamination Certificate
active
07135880
ABSTRACT:
A waveform formatter according to the present invention includes a first delay circuit for delaying a set signal to control the timing of a first change point of a test signal, a second delay circuit for delaying a reset signal to control the timing of a second change point of the test signal changed by the set signal which the first delay circuit delays, a third delay circuit for delaying a set signal to control the timing of a third change point of the test signal, a fourth delay circuit for delaying a reset signal to control the timing of a fourth change point of the test signal changed by the set signal which is delayed by the third delay circuit, a fifth delay circuit for delaying a set signal to control the timing of a first change point of an enable signal of the driver, a sixth delay circuit for delaying a reset signal to control the timing of a second change point of an enable signal with regard to the driver during a predetermined cycle of a cycle reference signal.
REFERENCES:
patent: 4806852 (1989-02-01), Swan et al.
patent: 5412258 (1995-05-01), Ogawa et al.
patent: 5703515 (1997-12-01), Toyama et al.
patent: 6604058 (2003-08-01), Nakayama
patent: 6907385 (2005-06-01), Yasui
patent: 60-194375 (1985-10-01), None
patent: 7-20582 (1995-11-01), None
patent: 11-316260 (1999-11-01), None
patent: 2001-091598 (2001-06-01), None
Japanese International Search Report dated May 13, 2004; Appl. No. PCT/JP2004/006460; (2 pages).
Partial translation of English abstract for publication Nos. 11-316260 and 60-194375, Nov. 16, 1999 and Oct. 2, 1985.
Supplementary European Search Report dated Jun. 20, 2006 for EP patent application No. 04732732, which corresponds to PCT/JP2004/006460, from which this application claims priority, 3 pages.
Patent Abstracts of Japan, Publication No. 2001-091598 dated Apr. 6, 2001, 2 pages.
Advantest Corporation
Karlsen Ernest
Osha & Liang LLP
Vazquez Arleen M.
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