Test apparatus

Details Test apparatus Test apparatus

2006-11-28

2006-11-28

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S073100, C714S724000

Reexamination Certificate

active

07142003

ABSTRACT:
There is provided a test apparatus that tests an electronic device. The test apparatus includes: a plurality of test modules operable to supply test patterns used for a test of the electronic device to the electronic device; a reference clock generation unit operable to generate a reference clock; a generation circuit operable to generate timing signals that cause the plurality of test modules to operate based on the reference clock; a plurality of timing sources being provided in response to the plurality of test modules and operable to supply the timing signals to the corresponding test modules; and a control unit operable to control phases of the timing signals supplied to each of the test modules by the plurality of timing sources so that timings at which each of the test modules outputs the test patterns according to the timing signals are made to be equal.

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