Test and burn-in socket for integrated circuits (ICs)

Details Test and burn-in socket for integrated circuits (ICs) Test and burn-in socket for integrated circuits (ICs)

2011-04-05

2011-04-05

Harvey, James (Department: 2833)

Electrical connectors

With coupling movement-actuating means or retaining means in...

For dual inline package

C439S073000

Reexamination Certificate

active

07918679

ABSTRACT:
Disclosed herein is a test and burn-in socket for integrated circuits. The socket includes a socket body (37). A lead guide (36) is provided under the socket body. A slide (35) is mounted to the socket body to move horizontally. A plurality of slide springs (39) is elastically supported between the slide and the socket body, thus allowing the slide to smoothly restore an original position thereof. A contact guide (31) is provided above the slide to guide positions of upper contact terminals of contacts. An IC guide (30) is provided above the contact guide to guide a position of an IC. A cover (21) is provided to move vertically from the socket body (37). A latch (29) presses the IC. The socket also includes the contacts (33).

REFERENCES:
patent: 5320559 (1994-06-01), Uratsuji et al.
patent: 5700155 (1997-12-01), Matsuoka
patent: 7828575 (2010-11-01), Hwang
patent: 2008/0207036 (2008-08-01), Hwang
patent: 2009/0275220 (2009-11-01), Hwang
patent: 08-50975 (1996-02-01), None
patent: 10-2001-15424 (2001-02-01), None
patent: 10-2003-22736 (2003-03-01), None

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