Test access control for secure integrated circuits

Details Test access control for secure integrated circuits Test access control for secure integrated circuits

2005-05-23

2010-06-01

Hoffman, Brandon S (Department: 2436)

Information security

Prevention of unauthorized use of data including prevention...

Access control

C714S025000

Reexamination Certificate

active

07730545

ABSTRACT:
Test access to an integrated circuit2is controlled by the use of test access enabling keys. A plurality of different test access enabling levels may be supported corresponding to different keys. The test access control may be performed by dedicated hardware or software executing a secure privilege mode.

REFERENCES:
patent: 2004/0210797 (2004-10-01), Kimelman et al.
patent: 817014 (1998-01-01), None

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