Test access architecture for testing of circuits modules at an i

Details Test access architecture for testing of circuits modules at an i Test access architecture for testing of circuits modules at an i

1993-11-05

1997-02-18

Nguyen, Vinh P.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, G01R 3128

Patent

active

056044321

ABSTRACT:
A test access architecture is implemented which allows embedded testing of reusable modules and their interconnections with each other and with primary system inputs and outputs, utilizing reusable test vectors regardless of the configuration of the integrated circuit. Also provided is a method and apparatus for controlling and observing signals within the logic of a module, using the same test access architecture.

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patent: 5434804 (1995-07-01), Bock et al.
Barnes; "Interconnection Test Arrangement"; IBM Technical Disclosure Bulletin; vol. 22, No. 8B; Jan. 1980.

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