Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate
2008-04-22
2008-04-22
Im, Junghwa M. (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
C257S750000, C257S784000, C257S747000, C257S760000, C257S762000, C257S763000, C257S764000, C257S737000, C257S780000, C257SE23020, C257SE23021, C438S118000
Reexamination Certificate
active
07361993
ABSTRACT:
Terminal pads and methods of fabricating terminal pads. The methods including forming a conductive diffusion barrier under a conductive pad in or overlapped by a passivation layer comprised of multiple dielectric layers including diffusion barrier layers. The methods including forming the terminal pads subtractively or by a damascene process.
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Coolbaugh Douglas D.
Edelstein Daniel C.
Eshun Ebenezer E.
He Zhong-Xiang
Rassel Robert M.
Capella Steven
Im Junghwa M.
International Business Machines - Corporation
Schmeiser Olsen & Watts
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