Optics: measuring and testing – Of light reflection
Reexamination Certificate
2011-03-01
2011-03-01
Evans, Fannie L. (Department: 2877)
Optics: measuring and testing
Of light reflection
C250S336100, C250S341100
Reexamination Certificate
active
07898668
ABSTRACT:
A terahertz spectrometer includes: a terahertz-wave generating element; an elliptical mirror; an optical lens configured to apply a terahertz wave generated by the terahertz-wave generating element, obliquely to a focusing plane of a first focus of the elliptical mirror; and a terahertz-wave detecting element arranged at a second focus of the elliptical mirror.
REFERENCES:
patent: 7315175 (2008-01-01), Cole
patent: 2004-191302 (2004-08-01), None
patent: 01-48457 (2001-07-01), None
Evans Fannie L.
K&L Gates LLP
Sony Corporation
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