Temperature tamper detection circuit and method

Coded data generation or conversion – Analog to or from digital conversion – Bipolar

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C341S141000

Reexamination Certificate

active

07362248

ABSTRACT:
A sensing circuit determines whether an integrated circuit is currently exposed to one of a relatively low or a relatively high temperature. A selection circuit selects a measured voltage across the base-emitter of a bipolar transistor if the sensing circuit indicates that the circuit is exposed to the relatively low temperature or, alternatively, selects a measured delta voltage across the base-emitter of the bipolar transistor if the sensing circuit indicates that the circuit is exposed to the relatively high temperature. A comparator compares the selected measured voltage against a first reference voltage indicative of a too cold temperature condition or compares the selected measured delta voltage against a second reference voltage indicative of a too hot temperature condition. As a result of the comparison, detection may be made as to whether the integrated circuit is currently exposed to a too cold or too hot temperature.

REFERENCES:
patent: 5185717 (1993-02-01), Mori
patent: 5239664 (1993-08-01), Verrier et al.
patent: 5394078 (1995-02-01), Brokaw
patent: 5400007 (1995-03-01), McClure
patent: 5535168 (1996-07-01), Yepez et al.
patent: 5619430 (1997-04-01), Nolan et al.
patent: 5854635 (1998-12-01), Wakamatsu et al.
patent: 6288638 (2001-09-01), Tanguay et al.
patent: 6489831 (2002-12-01), Matranga
patent: 6549053 (2003-04-01), Evans et al.
patent: 6600639 (2003-07-01), Teo et al.
patent: 6750683 (2004-06-01), McClure et al.
patent: 7030793 (2006-04-01), McLeod et al.
patent: 2002/0021590 (2002-02-01), Lammers et al.
patent: 2003/0118079 (2003-06-01), Marinet et al.
patent: 1081477 (2001-03-01), None
Partial European Search Report for EP 06255947.1-1236 dated Mar. 13, 2007.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Temperature tamper detection circuit and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Temperature tamper detection circuit and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Temperature tamper detection circuit and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2773833

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.