Electric heating – Heating devices – With power supply and voltage or current regulation or...
Reexamination Certificate
2011-03-22
2011-03-22
Paschall, Mark H (Department: 3742)
Electric heating
Heating devices
With power supply and voltage or current regulation or...
C219S494000, C392S418000
Reexamination Certificate
active
07910863
ABSTRACT:
A thermal plate of a PEB unit is divided into a plurality of thermal plate regions, and a temperature is settable for each of the thermal plate regions. A temperature correction value for adjusting the temperature within the thermal plate is settable for each of the thermal plate regions of the thermal plate. The line widths within the substrate for which a photolithography process has been finished are measured. The in-plane tendency of the measured line widths is decomposed into a plurality of in-plane tendency components using a Zernike polynomial. Then, in-plane tendency components improvable by setting the temperature correction values are extracted from the calculated plurality of in-plane tendency components and added to calculate an improvable in-plane tendency in the measured line widths. Then, the improvable in-plane tendency is subtracted from the in-plane tendency Z of the current processing states to calculate an after-improvement in-plane tendency.
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Office Action issued Sep. 7, 2010, in Japanese Patent Application No. 2006-141351 (with English-language translation).
Jyousaka Megumi
Tadokoro Masahide
Tomita Hiroshi
Jennison Brian
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Paschall Mark H
Tokyo Electron Limited
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