Temperature sensor scheme

Details Temperature sensor scheme Temperature sensor scheme

2005-08-23

2005-08-23

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C219S481000, C219S497000, C374S178000, C374S183000, C700S278000

Reexamination Certificate

active

06934645

ABSTRACT:
The present invention is a random access memory device including a temperature sensing circuit, and method of using the same. The temperature sensing circuit includes a first and a second comparator. Each comparator is configured to receive a sense voltage that is indicative of a sensed temperature. A first temperature reference circuit having a plurality of first reference voltages is coupled to the first comparator. The plurality of first reference voltages are alternately compared with the sense voltage. A second temperature reference circuit having a plurality of second reference voltages is coupled to the second comparator. The plurality of second reference voltages are alternately compared with the sense voltage. A first trimmer is coupled to the first temperature reference circuit. A second trimmer coupled to the second temperature reference circuit. The first and second trimmers are independently adjustable to adjust the plurality of first and second reference voltages.

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A copy of PCT International Search Report for International Application No. PCT/EP2004/010579 mailed on Jan. 25, 2005 (7 pages).

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