Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Patent
1996-07-29
1998-02-24
Cuchlinski, Jr., William A.
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
374208, 338 28, G01K 700, G01K 108
Patent
active
057205566
ABSTRACT:
A thermistor probe with improved heat transfer between the housing and the thermistor element is provided which includes a housing which is adapted to be disposed in an environment with a temperature to be measured by the probe. Within the housing is a thermally conductive insert which corresponds to a cavity within the housing. The insert has an aperture with a generally rectangular cross section to receive a thermistor disk. The thermistor disk has a positive or negative temperature coefficient of electrical resistance. The generally rectangular aperture is constructed such that the thermistor disk can be inserted into the aperture in a close fitting relationship with the aperture. While the entire outer surface of the thermistor disk may not be in contact with the walls of the aperture in the insert, the heat transfer between the housing and the thermistor disk (through the insert) is greatly improved over thermistor probes of the past.
REFERENCES:
patent: 3147457 (1964-09-01), Gill et al.
patent: 3890588 (1975-06-01), Kanaya et al.
patent: 4104509 (1978-08-01), Van Bokestal et al.
patent: 4166451 (1979-09-01), Salera
patent: 4246786 (1981-01-01), Wiemer et al.
patent: 4458835 (1984-07-01), Clawson et al.
patent: 4468555 (1984-08-01), Adachi et al.
patent: 4560973 (1985-12-01), Grimm et al.
patent: 4729672 (1988-03-01), Takagi
patent: 4841274 (1989-06-01), Yagher, Jr. et al.
patent: 5046857 (1991-09-01), Metzger et al.
patent: 5197805 (1993-03-01), Wilson
patent: 5199789 (1993-04-01), Mauric
patent: 5207765 (1993-05-01), Eiermann et al.
patent: 5273360 (1993-12-01), Wyatt et al.
patent: 5302934 (1994-04-01), Hart et al.
patent: 5367282 (1994-11-01), Clem
patent: 5373099 (1994-12-01), Boitard et al.
Cuchlinski Jr. William A.
Hirshfeld Andrew
Keystone Thermometrics Corporation
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