Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2011-08-16
2011-08-16
Verbitsky, Gail (Department: 2855)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C374S170000, C327S513000, C327S483000
Reexamination Certificate
active
07997794
ABSTRACT:
A temperature sensor circuit whose output voltage has high precision is provided. The temperature sensor circuit includes a Darlington circuit having bipolar transistors, a constant current circuit, and a current control circuit. Emitter currents of the bipolar transistors are made equal to one another by the constant current circuit. Base currents corresponding to the emitter currents of the respective bipolar transistors are sunk by the current control circuit.
REFERENCES:
patent: 3258606 (1966-06-01), Meadows
patent: 3488529 (1970-01-01), Howe
patent: 3560948 (1971-02-01), Inose et al.
patent: 3668541 (1972-06-01), Pease
patent: 3809928 (1974-05-01), Evans
patent: 3979688 (1976-09-01), Maidique
patent: 4024462 (1977-05-01), Highnote et al.
patent: 4331888 (1982-05-01), Yamauchi
patent: 4639755 (1987-01-01), Namiki et al.
patent: 4652144 (1987-03-01), Gunther et al.
patent: 4958090 (1990-09-01), Jansson
patent: 5039878 (1991-08-01), Armstrong et al.
patent: 5140181 (1992-08-01), Yoshino
patent: 5213416 (1993-05-01), Neely et al.
patent: 5414383 (1995-05-01), Cusdin et al.
patent: 5489861 (1996-02-01), Seymour
patent: 5539302 (1996-07-01), Takimoto et al.
patent: 5604466 (1997-02-01), Dreps et al.
patent: 5719533 (1998-02-01), Shibuya et al.
patent: 5859568 (1999-01-01), Le et al.
patent: 6046492 (2000-04-01), Machida et al.
patent: 6468825 (2002-10-01), Machida et al.
patent: 6733174 (2004-05-01), Matsumoto et al.
patent: 6825709 (2004-11-01), Motz
patent: 7011444 (2006-03-01), Mayusumi et al.
patent: 7400208 (2008-07-01), Yoshikawa
patent: 7901134 (2011-03-01), Sudo
patent: 2003/0155977 (2003-08-01), Johnson et al.
patent: 2003/0184327 (2003-10-01), Makino
patent: 2004/0124908 (2004-07-01), Lei
patent: 2008/0129380 (2008-06-01), Jin
patent: 2008/0198899 (2008-08-01), Igarashi
patent: 2008/0285624 (2008-11-01), Igarashi
patent: 2009/0059997 (2009-03-01), Sudo
patent: 2009/0153227 (2009-06-01), Ooe et al.
patent: 2009/0294870 (2009-12-01), Arai et al.
patent: 57099789 (1982-06-01), None
patent: 61067232 (1986-04-01), None
patent: 5-248962 (1993-09-01), None
Brinks Hofer Gilson & Lione
Seiko Instruments Inc.
Verbitsky Gail
LandOfFree
Temperature sensor circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Temperature sensor circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Temperature sensor circuit will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2648494