Electricity: electrical systems and devices – Safety and protection of systems and devices – Circuit interruption by thermal sensing
Patent
1991-05-29
1993-08-17
DeBoer, Todd E.
Electricity: electrical systems and devices
Safety and protection of systems and devices
Circuit interruption by thermal sensing
323907, 257467, H02H 504
Patent
active
052374815
ABSTRACT:
A semiconductor diode array monolithically integrated onto a power MOS transistor or power IGBT for temperature sensing. With the application of a positive bias and a constant current, the diode array provides a voltage that varies linearly as a function of temperature for the power transistor. The diode array is constructed in such a manner so as to prevent latch-up (i.e. where a parasitic silicon controlled rectifier is turned on, locking the power transistor in an on condition) and voltage breakdown (i.e. where the diode malfunctions from excessive voltage). The diode array includes at least three diodes that are either in parallel or are in series. The two types of diode array can be used in either a high-side driver circuit or a low-side driver circuit.
REFERENCES:
patent: 4446419 (1984-05-01), Plassche et al.
patent: 4682195 (1987-07-01), Yilmaz
patent: 4881120 (1989-11-01), Nakagawa et al.
patent: 5063342 (1991-11-01), Hughes et al.
S. Soclof, "Applications of Analog Integrated Circuits," Prentice Hall (1985) pp. 273-284.
Blanchard Richard A.
Soo David H.
Zommer Nathan
Deboer Todd E.
Ixys Corporation
LandOfFree
Temperature sensing device for use in a power transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Temperature sensing device for use in a power transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Temperature sensing device for use in a power transistor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2249134