Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2011-07-19
2011-07-19
Bennett, Brad (Department: 2841)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C327S512000
Reexamination Certificate
active
07980759
ABSTRACT:
The present invention discloses a temperature sensing circuit which is adaptive toward low voltage IC environment, it mainly comprises: a temperature sensing unit, a temperature threshold control unit and a transconductance amplifier. The temperature sensing unit includes a bipolar transistor and PMOS transistors, and senses temperature via detecting voltage. The temperature threshold control unit includes PMOS transistors and NMOS transistors, and makes an over-temperature alert signal persistently sent out until temperature is lowered to a specified value when the temperature sensing unit detects an over-temperature state. The transconductance amplifier includes PMOS transistors and NMOS transistors, and makes the temperature sensing circuit of the present invention adapt to a low voltage IC environment. Further, the circuit architecture of the present invention does not require any use of operational amplifier or band-gap voltage reference source. Therefore, the present invention can reduce the production and design cost.
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Bennett Brad
Ming Chow Sinorica, LLC
Tai-1 Microelectronics Corp.
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