Electrical transmission or interconnection systems – Personnel safety or limit control features – Interlock
Patent
1989-11-09
1991-08-13
Hudspeth, David
Electrical transmission or interconnection systems
Personnel safety or limit control features
Interlock
307355, 307491, 323907, H03K 3295
Patent
active
050398784
ABSTRACT:
In order to sense the temperature of an integrated circuit chip, a semiconductor junction device (D1) integrated on the chip is used to generate a first signal (V.sub.1) having a known variation with temperature. A second signal (V.sub.2) is generated by passing a PTAT current (I.sub.2) through a resistor (R1) so that the second signal (V.sub.2) has a known variation with temperature which is opposite in sign to that of the first signal (V.sub.1). The two signals are compared (42) to generate an output signal (OT) which is dependent on whether the temperature of the chip is below or above a predetermined threshold temperature. The current (I.sub.1) through the junction device (D1) is also PTAT, which provides a more accurate definition of the threshold temperature in terms of integrated circuit parameters.
REFERENCES:
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patent: 4475103 (1984-10-01), Brokaw et al.
patent: 4497586 (1985-02-01), Nelson
patent: 4733162 (1988-03-01), Haga et al.
R. C. Jaeger and D. V. Kerns, "Integrated MOS Temperature Sensor", Apr. 13-16, 1980, pp. 161-162, CH 1558-IEEE.
R. C. Jaeger, "Temperature Sensor", Sep. 1979, vol. 22 No. 4, pp. 1346-1347m IBM Technical Disclosure Bulletin.
European Patent Application, 0 344715, Masayuki
Armstrong Desmond R.
Hughes John B.
Franzblau Bernard
Hudspeth David
Sanders Andrew
U.S. Philips Corporation
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