Temperature scanning reactor method

Details Temperature scanning reactor method Temperature scanning reactor method

1994-07-14

1996-05-28

Housel, James C.

Chemistry: analytical and immunological testing

Rate of reaction determination

436147, 422 99, 422130, G01N 3110

Patent

active

055210953

ABSTRACT:
A method for rapidly collecting kinetic rate data from a temperature scanning reactor for chemical reactions. The method, which is particularly useful for studying catalytic reactions, involves ramping (scanning) of the input temperature to a reactor and recording of output conversion and bed temperature without waiting for isothermal steady state to be established.

REFERENCES:
patent: 3578404 (1971-05-01), Walles et al.
patent: 4667730 (1987-05-01), Zemp
patent: 5340745 (1994-08-01), Wojciechowski et al.

Affiliated with

Also associated with

Rating

Temperature scanning reactor method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Temperature scanning reactor method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Temperature scanning reactor method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-786130