Measuring and testing – Gas analysis – Detector detail
Reexamination Certificate
2007-01-02
2007-01-02
Williams, Hezron (Department: 2856)
Measuring and testing
Gas analysis
Detector detail
C250S288000
Reexamination Certificate
active
10972327
ABSTRACT:
A temperature-programmed desorbed gas analyzing apparatus including a sample chamber1in which a sample S is disposed, an infrared heating furnace2for heating the sample S disposed in the sample chamber1,a measuring chamber3in which gas desorbed from the sample S by heating is introduced, a turbo molecular pump4for reducing the pressure in the measuring chamber3,a mass spectrometer5having a gas detection portion5adisposed in the measuring chamber3,an intermediate pressure-reduced chamber6provided between the sample chamber1and the measuring chamber3,a first orifice7which the intermediate pressure-reduced chamber6and the sample chamber1intercommunicate with each other, and a second orifice8through which the intermediate pressure-reduced chamber6and the measuring chamber3intercommunicate with each other, and the desorbed gas occurring in the sample chamber1is introduced through the first orifice7,the intermediate pressure-reduced chamber6and the second orifice8into the measuring chamber3.The pressure in the intermediate pressure-reduced chamber6or the measuring chamber3is controlled by pressure adjusting unit so as to be fixed.
REFERENCES:
patent: 4902891 (1990-02-01), Vestal
patent: 5552600 (1996-09-01), Davies et al.
patent: 5565679 (1996-10-01), Tanner et al.
patent: 5742050 (1998-04-01), Amirav et al.
patent: 5869344 (1999-02-01), Linforth et al.
patent: 6265717 (2001-07-01), Sakata et al.
patent: 6576898 (2003-06-01), Waki
patent: 6797947 (2004-09-01), Russ et al.
patent: 2003/0122069 (2003-07-01), Kato
patent: 2003/0209666 (2003-11-01), Hirabayashi et al.
patent: 2004/0011955 (2004-01-01), Hirano et al.
patent: 2004/0262512 (2004-12-01), Tobita et al.
patent: 0 700 068 (1996-03-01), None
patent: 09270244 (1997-10-01), None
patent: 10325827 (1998-12-01), None
Journal of the Mass Spectrometry Society of Japan, vol. 46, No. 4, pp. 402 and 403, 1998.
Arii Tadashi
Matsuo Shuichi
Takata Yoshihiro
Rigaku Corporation
Rogers David A.
Westerman, Hattori, Daniels & Adrian , LLP.
Williams Hezron
LandOfFree
Temperature-programmed desorbed gas analyzing apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Temperature-programmed desorbed gas analyzing apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Temperature-programmed desorbed gas analyzing apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3727347