Temperature profile detector

Thermal measuring and testing – Temperature measurement – Temperature distribution or profile

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

338 28, 340590, 374160, 374183, 376247, G01K 1100, G01K 1300

Patent

active

044089040

ABSTRACT:
A temperature profile detector shown as a tubular enclosure surrounding an elongated electrical conductor having a plurality of meltable conductive segments surrounding it. Duplicative meltable segments are spaced apart from one another along the length of the enclosure. Electrical insulators surround these elements to confine molten material from the segments in bridging contact between the conductor and a second electrical conductor, which might be the confining tube. The location and rate of growth of the resulting short circuits between the two conductors can be monitored by measuring changes in electrical resistance between terminals at both ends of the two conductors. Additional conductors and separate sets of meltable segments operational at differing temperatures can be monitored simultaneously for measuring different temperature profiles.

REFERENCES:
patent: 2587506 (1952-02-01), Moreland
patent: 2750482 (1956-06-01), Peterson
patent: 4058014 (1977-11-01), Durand
patent: 4159447 (1979-06-01), Gernhardt et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Temperature profile detector does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Temperature profile detector, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Temperature profile detector will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1272505

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.