Temperature profile detector

Induced nuclear reactions: processes – systems – and elements – Testing – sensing – measuring – or detecting a fission reactor... – Temperature or pressure measurement

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Details

324 65R, 340590, 374106, G01K 1106, G21C 1700

Patent

active

043882676

ABSTRACT:
Temperature profiles at elevated temperature conditions are monitored by use of an elongated device having two conductors spaced by the minimum distance required to normally maintain an open circuit between them. The melting point of one conductor is selected at the elevated temperature being detected, while the melting point of the other is higher. As the preselected temperature is reached, liquid metal will flow between the conductors, creating short circuits which are detectable as to location.

REFERENCES:
patent: 2518789 (1950-08-01), Jackson
patent: 3046536 (1962-07-01), Sciuto
patent: 3527098 (1970-09-01), Salgado

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