Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2008-05-29
2010-11-30
Caputo, Lisa M (Department: 2855)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C327S512000
Reexamination Certificate
active
07841770
ABSTRACT:
A temperature measuring system and a measuring method using the same are disclosed. The method for measuring an integrated circuit temperature includes the steps of: detecting a first difference in output voltage values between a first transistor and a second transistor by providing a first current through the first transistor and a second current through the second transistor; detecting a second difference in output voltage values between the first transistor and the second transistor by providing the second current through the first transistor and the first current through the second transistor; obtaining an average value by averaging the first difference and the second difference; and determining the temperature by multiplying the average value with a predetermined value.
REFERENCES:
patent: 5892221 (1999-04-01), Lev
patent: 6008685 (1999-12-01), Kunst
patent: 6242974 (2001-06-01), Kunst
patent: 6808307 (2004-10-01), Aslan et al.
patent: 6991369 (2006-01-01), Garavan
patent: 7082377 (2006-07-01), Aslan et al.
patent: 2008/0259998 (2008-10-01), Venkataraman et al.
Chao Po-Yin
Lee Ean-Sue
Bacon & Thomas PLLC
Caputo Lisa M
Hycon Technology Corp.
Jagan Mirellys
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