Temperature-measuring-resistor, manufacturing method therefor, r

Details Temperature-measuring-resistor, manufacturing method therefor, r Temperature-measuring-resistor, manufacturing method therefor, r

1996-06-03

1998-09-08

Berhane, Adolf

Electrical resistors

Resistance value responsive to a condition

Ambient temperature

338 22SD, 338 22R, H01C 304

Patent

active

058050493

ABSTRACT:
The invention relates to a temperature-measuring-resistor which comprises vanadium oxide as a matrix material. The matrix material further contains at least one member selected from a metal, a metal oxide and a metal nitride, and the member has an electric conductivity higher than that of the vanadium oxide. The temperature-measuring-resistor has a low room temperature resistivity, and a volume resisivity that varies greatly with temperature.

REFERENCES:
patent: 3899407 (1975-08-01), Eastwood et al.
patent: 3932312 (1976-01-01), Kazmierowicz
patent: 4007435 (1977-02-01), Tien
patent: 4020443 (1977-04-01), Leroy et al.
patent: 4068281 (1978-01-01), Harnden, Jr.
patent: 4562057 (1985-12-01), Goddard et al.
patent: 4647895 (1987-03-01), Howng
patent: 4743881 (1988-05-01), Howng
V.sub.2 O.sub.3 based PTC Resistor with High Electrical Conductivity, Technical Research Report No. CPM86-28, Telecommunication Academic Society, Jul. 28, 1986, pp. 21-26.

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