Temperature measurement using changes in dielectric constant...

Details Temperature measurement using changes in dielectric constant... Temperature measurement using changes in dielectric constant...

2007-04-13

2009-12-29

Verbitsky, Gail (Department: 2855)

Thermal measuring and testing

Temperature measurement

In spaced noncontact relationship to specimen

C374S117000, C374S104000, C374S122000, C702S130000

Reexamination Certificate

active

07637656

ABSTRACT:
A temperature measurement technique for calculating a temperature in a high temperature environment by monitoring a change in resonant frequency of a resonant structure loaded with a dielectric material. A response curve for a reflection coefficient S11 associated with the resonant structure is generated, typically by the use of a network analyzer connected to the resonant structure via a cable. A minimum point for the response curve is identified to detect the resonant frequency for the resonant structure. A calibration map is applied to the minimum point to identify a temperature associated with the resonant frequency of the resonant structure. The temperature associated with the resonant frequency of the resonant structure represents the temperature of the high temperature environment.

REFERENCES:
patent: 4568200 (1986-02-01), Hatono et al.
patent: 6489917 (2002-12-01), Geisheimer et al.
patent: 6856281 (2005-02-01), Billington et al.
patent: 2008/0159353 (2008-07-01), Bosselmann et al.
patent: WO 2006042807 (2006-04-01), None
International Search Report, PCT/US2007/009263, Sep. 17, 2008.

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