Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Patent
1992-05-28
1993-09-21
Cuchlinski, Jr., William A.
Thermal measuring and testing
Temperature measurement
In spaced noncontact relationship to specimen
128736, 128664, 374130, 374133, 374129, G01K 120, G01J 508, G01J 562, G01J 510
Patent
active
052462927
ABSTRACT:
Temperature measurement apparatus comprising an IR temperature change detector, a chopper for intermittently exposing the detector to an object whose temperature is to be measured, and means for providing an output indication representing the temperature of the object in response to the output of the detector, wherein the chopper is driven by a quartz timepiece movement.
REFERENCES:
patent: 2920485 (1960-01-01), Derganc
patent: 3091693 (1963-05-01), Rudomanski et al.
patent: 3293915 (1966-12-01), Banca et al.
patent: 3463006 (1969-08-01), Paddock et al.
patent: 3611806 (1971-10-01), Hishikari
patent: 3766781 (1973-10-01), Roberts
patent: 3884075 (1975-05-01), Brandli et al.
patent: 4005605 (1977-02-01), Michael
patent: 4031365 (1977-06-01), Raggiotti et al.
patent: 4045670 (1977-08-01), Anderson et al.
patent: 4072863 (1978-02-01), Roundy
patent: 4148304 (1979-04-01), Mull
patent: 4375033 (1983-02-01), Bjorkholm et al.
patent: 4396020 (1983-08-01), Wolff et al.
patent: 4602642 (1986-07-01), O'Hara et al.
patent: 4611153 (1986-09-01), Wesling
patent: 4634294 (1987-01-01), Christol et al.
patent: 4693615 (1987-09-01), Kyriakis
patent: 4743122 (1988-05-01), Yamano et al.
patent: 4771791 (1988-09-01), Kubouchi
patent: 4784149 (1988-11-01), Berman et al.
patent: 4790324 (1988-12-01), O'Hara et al.
patent: 4797840 (1989-01-01), Fraden
patent: 4887229 (1989-12-01), Weiss
patent: 4907895 (1990-03-01), Everest
patent: 4932789 (1990-06-01), Egawa et al.
patent: 4955727 (1990-09-01), Weiss
patent: 4986672 (1991-01-01), Beynon
patent: 5001657 (1991-03-01), Yagura et al.
patent: 5017018 (1991-05-01), Iuchi et al.
patent: 5018872 (1991-05-01), Susynski et al.
patent: 5123751 (1992-06-01), Baker
patent: 5157684 (1992-10-01), Benda et al.
Gal Eli
Gerlitz Yonatan
Moran Dan
Cuchlinski Jr. William A.
Gutierrez Diego F. F.
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