Measuring and testing – Gas analysis – Moisture content or vapor pressure
Patent
1978-11-29
1980-07-01
Woodiel, Donald O.
Measuring and testing
Gas analysis
Moisture content or vapor pressure
73 1F, 73362AR, G01K 120
Patent
active
042100240
ABSTRACT:
A temperature measurement apparatus comprising a temperature sensitive device such as thermistor and a reference resistor of small temperature coefficient of resistance, which are alternatively connected to an electric circuit which produces an output signal responding to change of resistance, and the apparatus comprises a memory which memorizes a reference output signal by a reference resistor at a predetermined reference environmental temperature and a reference voltage of a power source, and a calibration is made to a measured temperature value by use of said memorized reference output signal.
REFERENCES:
patent: 3564420 (1971-02-01), Webb
patent: 3657926 (1972-04-01), Munson et al.
patent: 4041382 (1977-08-01), Washburn
patent: 4125023 (1978-11-01), Amemiya et al.
Ishiwatari Hiromasa
Yamada Yoshinori
Matsushita Electric - Industrial Co., Ltd.
Woodiel Donald O.
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