Thermal measuring and testing – Temperature measurement – Temperature distribution or profile
Reexamination Certificate
2011-01-04
2011-01-04
Caputo, Lisa M (Department: 2855)
Thermal measuring and testing
Temperature measurement
Temperature distribution or profile
C374S112000, C374S113000, C374S114000, C327S512000
Reexamination Certificate
active
07862229
ABSTRACT:
A system, device, and method for minimizing x-axis and/or y-axis offset shift due to internally produced as well as externally produced on chip temperature imbalances. At least one temperature gradient canceling device is disposed on a substrate including a temperature gradient sensitive device having at least one pair of sensors. Voltage signals generated by the temperature gradient canceling devices can be combined with voltage signals generated by each of the pair of sensors to account for the offset.
REFERENCES:
patent: 4232553 (1980-11-01), Benedetto et al.
patent: 4300392 (1981-11-01), Bloomer et al.
patent: 7305881 (2007-12-01), Zhao et al.
patent: 2006/0179940 (2006-08-01), Liu et al.
patent: 2009/0145226 (2009-06-01), Cai
Cai Yongyao
Dribinsky Alexander
O'Brien Gary J.
Pucci Gregory P.
Varghese Mathew
Caputo Lisa M
Jagan Mirellys
Memsic Inc.
Weingarten Schurgin, Gagnebin & Lebovici LLP
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