Temperature-gradient cancelation technique and device

Thermal measuring and testing – Temperature measurement – Temperature distribution or profile

Reexamination Certificate

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Details

C374S112000, C374S113000, C374S114000, C327S512000

Reexamination Certificate

active

07862229

ABSTRACT:
A system, device, and method for minimizing x-axis and/or y-axis offset shift due to internally produced as well as externally produced on chip temperature imbalances. At least one temperature gradient canceling device is disposed on a substrate including a temperature gradient sensitive device having at least one pair of sensors. Voltage signals generated by the temperature gradient canceling devices can be combined with voltage signals generated by each of the pair of sensors to account for the offset.

REFERENCES:
patent: 4232553 (1980-11-01), Benedetto et al.
patent: 4300392 (1981-11-01), Bloomer et al.
patent: 7305881 (2007-12-01), Zhao et al.
patent: 2006/0179940 (2006-08-01), Liu et al.
patent: 2009/0145226 (2009-06-01), Cai

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