Thermal measuring and testing – Temperature measurement – Temperature distribution or profile
Patent
1997-03-10
1998-10-20
Gutierrez, Diego F.F.
Thermal measuring and testing
Temperature measurement
Temperature distribution or profile
374161, 25022718, 25022723, 356 44, 356301, 364557, G01K 1132, G01K 306
Patent
active
058258043
ABSTRACT:
A temperature distribution measuring apparatus and related method uses optical time domain reflectometry to determine temperature distribution along an optical fiber. A light pulse enters the fiber at one end, and backscattered light at each of various points in the optical fiber has a Raman spectrum which contains temperature information. An impulse response to the Raman spectra of backscattered light is produced using a transformation to provide a temperature distribution along the optical fiber. An impulse response on the anti-Stokes component and an impulse response of the Stokes component of the Raman spectrum are each produced, and the ratio between them indicates temperature distribution. Each impulse response is obtained by performing deconvolution on the Stokes component and the anti-Stokes component using an inverse matrix of measured incident light, the inverse matrix being obtained by an iteration method with an optimum number of iterations.
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Gutierrez Diego F.F.
Kabushiki Kaisha Toshiba
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