Temperature detector on an integrated circuit

Details Temperature detector on an integrated circuit Temperature detector on an integrated circuit

1995-08-30

1997-11-11

Callahan, Timothy P.

Miscellaneous active electrical nonlinear devices, circuits, and

External effect

Temperature

327378, 323315, H01L 3500

Patent

active

056868588

ABSTRACT:
An integrated circuit including a temperature threshold detector. This detector includes two MOS transistors with a same type of conductivity, circuitry for applying to the second transistor a gate-source voltage higher than the gate-source voltage of the first transistor by a value Vbe, VbE being the drop in voltage at the terminals of a forward-biased PN junction, and a comparator for comparing the currents flowing in the two transistors. The current in the second transistor diminishes faster than the current in the first transistor. If the dimensions of the transistors are accurately chosen, the curves pertaining to the diminishing of current (or curves deduced from these curves by homothetic transformation) intersect one another for a certain temperature. The detection of equality of the currents therefore enables a detection of the passage through this temperature.

REFERENCES:
patent: 4645948 (1987-02-01), Morris et al.
patent: 4659944 (1987-04-01), Miller, Sr. et al.
patent: 5039878 (1991-08-01), Armstrong et al.
patent: 5159520 (1992-10-01), Toyooka et al.
patent: 5304861 (1994-04-01), Fruhauf et al.
patent: 5434534 (1995-07-01), Lucas
patent: 5477176 (1995-12-01), Chang et al.
patent: 5563760 (1996-10-01), Lowis et al.

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